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	Equipment


















	The Ultra-Low Temperature，High Magnetic Field，Dual Tip UHV Scanning
	Tunneling Microscope / Spectrum（STM/STS）System
	Functionary：Dong-Min Chen，Qi-Kun Xue，Xue-Jin Liang
	The entiresystem mainly consists of a changeable dual tip STM, varying temperature duwar, superconductive magnet and ultra-high vacuum
	subsystems.In addition the matched electronic controlling subsystem, DSP data sampling, analysis and processing subsystem,magnetic-optics and
	optical measurement subsystem, feeble transport signal measurement and vibration isolating subsystems etc. are developed. Compared with low-
	temperature and high magnetic field STM system made by NIST this system has the following features:
	1. The independent dual tip STM is sat up, each with position sensor;
	2. The sample can be rotated continuously relative to magnetic field direction;
	3. The dual tip STM part can be changed easily;
	4. By using optical windows we can make magnetic-optical measurement and characterization of optical properties of nano-structures under extreme
	conditions;
	5. The micro-structure transport measuring subsystem. Also the specific developped MBE chamber can be used for the growth of III-V
	semiconductor with magnetic adulterant, which are important samples for the spintronics research.

	The High-Resolution transmission Electron Microscopy (TEM) with Scanning Probe Microscopy (SPM) System
	Functionary: Zhong-Lin Wang, Dong-Min Chen, En-Ge wang, Xue-Dong Bai, Xue-Jin Liang
	The TEM is equipped with electron energy loss spectroscopy (EELS) and X-ray energy dispersion spectroscopy (EDS), by which the
	microstructue,Electronic structure,phononic structure and chemical composition of nano-materials,including nanoparticals, nanotubes, nanofibers,
	quantum dots,and quantum wires etc, can be measured. The The SPM has two tipsfor in-situ manipulations and property measurements of the nano-
	scale samples.This TEM-SPm system opens up a new approach for TEM imaging and simultaneous physical measurements of nano-materials. The
	interesting structural information of a nanostructure provided by TEM can be directly correlated with the properties measured in site from the same
	local area. The system is fit for measuring the mechanical properties,field electron emission properties,electrical properties,and chemical properties of
	the low-dimensional structures, as well as their local atomic and electronic structures, which is one of the most powerful instruments in characterizing
	microstructures and properties of nano-materials.


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